![一站式-手机端-仿真](http://edadoc.com/upload/images/slides/20231027/16983691618966257.jpg)
定制化夹具
![pi_new_img](http://www.edadoc.com/upload/images/product/20220822/16611498327526173.png)
根据客户的测试需求,定制相关夹具:
1、自定义背板/连接器,国内外分立电阻电容电感器件, 自研芯片、线缆等测试夹具
2、符合测试标准,精确测量客户待测物的真实性能
3、可根据测试场景选择TRL/ISD/AFR等多种去嵌方法,均能完全去除夹具的影响,去嵌精度:回损-40dB@67GHz,插损±0.1dB@67GHz
![jc_img1](http://www.edadoc.com/upload/images/product/20220822/16611498675113725.jpg)
国产分立器件测试夹具
![jc_img2](http://www.edadoc.com/upload/images/product/20220822/16611498675042678.jpg)
5G天线连接器夹具测试
去嵌精度&测试精度
![jc_img3](http://www.edadoc.com/upload/images/product/20220822/16611498687078605.jpg)
去嵌方式对比
可以使用多种不同的去嵌方式实现测试产品DUT,均能保证高精度的去嵌测试
![16611498676155798 (1)](http://www.edadoc.com/upload/images/product/20220915/16632379335129003.jpg)
TRL校准精度
TRL去嵌精度做到50Ghz+,IL小于±0.1db,RL小于-35db。
仿测校准案例
![jc_img5](http://www.edadoc.com/upload/images/product/20220822/16611498678023209.jpg)
带SMA头的仿真测试拟合
![jc_img6](http://www.edadoc.com/upload/images/product/20220822/16611498681560529.jpg)
插损回损拟合
![jc_img7](http://www.edadoc.com/upload/images/product/20220822/16611498687387382.jpg)
TDR阻抗拟合